Workshop on X-ray Scattering Methods for Thin Film Characterization

25 - 26 September 2014, Prague, Czech Republic

Login - Lectures

Venue:

Faculty of Math. & Physics
Charles University in Prague
Ke Karlovu 5
121 16 Prague 2
Czech Republic

The Faculty of Mathematics and Physics of the Charles University in Prague and PANalytical B.V., Netherlands cordially invite you to attend this workshop on X-ray scattering methods for the characterization of thin layered structures.

About the workshop:
The 2-day workshop will consist of 5 key lectures from X-ray experts addressing the interest to all those using X-rays methods to examine thin layered structures. Participants who will submit an abstract can present their recent results in short oral presentations (10-15 minutes) or in poster sessions. In order to have the sufficient chance for open discussion of the topics, attendance will be limited to around 50 participants. Reserve your place in this workshop by an early registration.

Topics to be covered:

  • X-ray diffraction from thin layered structures
  • X-ray diffraction from nanostructures
  • X-ray diffraction from polycrystalline layers
  • X-ray reflectometry
  • SAXS & GISAXS

 

Who should attend:

  • Graduate and post-graduate students
  • Research scholars
  • Academic faculty
  • Industry people

 

Registration Fee (includes admission, course materials, lunches and coffee breaks, welcome reception):

Students: 90 €
Academic & Research scholar: 120 €
Industry delegates: 150 €
Accompanying person to Welcome Reception 35 €

Register under: button "REGISTRATION"

 

Welcome Reception: 

On Thursday September 25th, 2014 at 18:30 there will be a reception with drinks and food in Restaurant Zvonařka 

There is a possibility to take an accompanying person with you for the fee 35 Eur. In case of your interest please contact Mrs. Anděla Sechovská Barotová on This email address is being protected from spambots. You need JavaScript enabled to view it.

 

Abstract submission:

Abstract length should be limited to 1000 characters (only plain text, no figures).

Submit your abstract under: "ABSTRACT SUBMISSION" - you have to be registered first

Authors will be notified of the mode of presentation of their contribution by August 15, 2014.

 

Extended deadline for submission of abstracts and registration: August 1, 2014

 

 

Organizers:
1) Vaclav Holy (Charles University in Prague, Czech Republic) This email address is being protected from spambots. You need JavaScript enabled to view it.


2) Joachim Woitok (PANalytical, Netherlands) This email address is being protected from spambots. You need JavaScript enabled to view it.

 

3) Registration and payments - Anděla Sechovská Barotová (Splendid Production s.r.o.) This email address is being protected from spambots. You need JavaScript enabled to view it.   

 

For further information contact:
Ms. A. van der Kolk, Marcom Account Manager
PANalytical B.V. , Corporate Marketing & Communication
P.O. Box 13, 7600 AA Almelo
The Netherlands
E-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.

 

 

We look forward to seeing you in Prague for stimulating discussions on X-ray methods for thin film characterization!

 

IMPORTANT DEADLINES

shifted to August 1, 2014:     Deadline registration and abstract submission
August 15, 2014:     Notification of mode of presentation

                            

                             

                            

 

Copyright © 2014. All Rights Reserved - Štěpán Sechovský.