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Title: Ubaid Ahmed: Statistical analysis of size parameters of inclusions and cracks studied by x-ray methods
Number: 1/22
Status: Closing date exceeded
Begin: Thursday, 06.01. 2022, 14:00
Tutor: Václav Holý, Milan Dopita
Location: The seminar will be held on Thursday, January 6 2022 at 2pm in room F2, MFF UK Ke Karlovu 5, and via the zoom meeting: 994 6632 8251

nanocent


Nano Seminar

Thursday, 6. 1. 2022, 14.00

Lecture room F2, MFF UK Ke Karlovu 5
and via the zoom meeting: https://cesnet.zoom.us/j/99466328251
password is on question via email: This e-mail address is being protected from spambots. You need JavaScript enabled to view it

Ubaid Ahmed

Department of Condensed Matter Physics, Faculty of Mathematics and Physics, Charles University

Statistical analysis of size parameters of inclusions and cracks studied by x-ray methods

X-RAY measurements of in-situ deformed, annealed or inclusion incorporated materials prepared by various methods or treatments like cyclic loaded shape memory alloys or 3D printed material etc. The samples will be experimentally characterized by Standard X-RAY Powder Diffraction (XRD), Small Angle X-RAY Diffraction (SAXS) and High-resolution Computed Tomography (HR-CT). Grain size distribution, micro-deformations, porosity and void density are determined using XRD and SAXS. HR-CT is used to reconstruct the spatial distribution of grains and voids in the samples. Different types of inclusions/defects/inhomogeneities have different contrast and different detection limit for each of the x-ray methods. Final goal will be determining these limits from the experimental results and define an overlap between these methods.

[1] A. Guinier and G. Fournet, Small‐Angle Scattering of X‐rays, 1955
[2] B. E. Warren, X‐ray diffraction, Dover, New York, 1990
[3] Carmignato, Simone, Wim Dewulf, and Richard Leach, eds. Industrial X-ray computed tomography. Cham: Springer International Publishing, 2018.
[4] Jiang Hsieh, Computed Tomography Principles, Design, Artifacts, and Recent Advances, 2nd Edition , Wiley & Sons, 2009 (ISBN: 978-0-470-56353-3)

*corresponding author: e-mail: This e-mail address is being protected from spambots. You need JavaScript enabled to view it